... Modeling Hot-Carrier Effects For n-channel MOSFETs, I,, or (Ib/Id) is a well accepted monitor for hot- carrier induced degradation. However, for p-channel MOSFETs both 1, [45] and ... prediction method for hot-carrier-stressed p-MOS transistors’, IEEE IEDM-91, Tech. Dig., pp. 52 5-5 28 (1988). [45] W. Weber and F. Lau, ‘Hot-carrier drifts in submicrometer p-channel MOSFETs’, IEEE ... hot-electrons/holes and degradation for p- and n-channel MOSFETS’, IEEE Electron Device Lett., EDL-6, pp. 8-1 1 (1985). M. Koyanagi, A. G. Lewis, J. Zhu, R. A. Martin, T. Y. Huang, and...