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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 2 ppt

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 1 potx

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 1 potx

... Temperature Coefficient SID 12 I Overview 13 1 c 41 I 51 16 1 17 1 18 1 19 1 c1 01 11 21 c1 31 11 41 c1 51 c1 91 E. H. Snow, A. S. Grove, B. E. Deal, and C. T. Sah, ‘Ion transport ... integration’, ibid, ED- 31, pp. 15 5 5 -1 5 61 (19 84). 1. 1 Circuit Design and MOSFETs 3 1. 1 Circuit Design with MOSFETs For today’s circuit design, computer-aided simulation [ 15 1- [ 17 1 has become ... Voltage 12 1 4 .1. 1 Work Function 12 3 4 .1. 2 Oxide Charges 12 7 4 .1. 3 Flat Band Voltage 13 1 4.2 .1 Accumulation 13 5 4.2 MOS Capacitor at Non-Zero Bias 13 3 ...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 2 ppt

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 2 ppt

... for silicon can be modeled using the following polynomial equation [ 151 1 .20 6 -2 .73 x lOP4T (2. 2a) 1.178 5-9 . 025 x 1 0-5 T-3.05 x 10p7T2 (2. 2b) 1.17+ 1.059 x 10p5T-6.05 x 1 0-7 T2 ... Fermi-Dirac At 77K ni for silicon is -1 0 -2 0cm-3, while at 400K its value is -1 O'*~m-~ 28 2 Basic Semiconductor and pn Junction Theory nonequilibrium condition we have (2. 1 ... temperature 25 0-4 15 K, while at temperatures below 25 0 K, E, is modeled to within 2 meV [l5]. Note that both Eqs. (2. 2a) and (2. 2b) are accurate for 25 0 < T < 300 K. Although Eq. (2. 2)...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 3 docx

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 3 docx

... + + pMOST - - - + terminal voltages as drain-source voltage Vds( = V, - VJ, gate-source voltage V,,( = V, - V,), and bulk-source voltage vb,( = vb - Vs). For normal DC ... has heavily doped p+ source and drain regions with 80 Z 4 LL 0 - W/L = to, = V. 3 MOS Transistor Structure and Operation -4 .0 -3 .2 -2 .4 -1 .6 -0 .8 0 0.8 1.6 GATE VOLTAGE, ... Semiconductor and pn Junction Theory The variables F,,F, and F3 are F, =- *bi [l -( 1 - F,)&apos ;-& quot;] (1 -4 F2 = (1 - F,)l+m F, = 1 - F,(1 + m) (2.87) where F,...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 4 doc

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 4 doc

... expression for Rsp, based on the assumption of uniform doping 128 4 MOS Capacitor I- -t > O O+ -0 .6 1 A1 (p-Si n+ Po~y(p-si) -o-8 -I .o Nb (~rn-~) _t Fig. 4. 5 Work ... Structure and Operation ~i 1; L 6i! - - - - - - - - - Fig. 3.3 1 Cross-section showing overlap capacitances between the source/drain and the gate which give rise to C,,, and CGDo ... @m - (x, + Eg + q4f) (V) (4. 6) or Oms = -0 .51 - 4f (V) p-type Si. I (4. 7) Since CDf is typically 0.3V, am, is a negative number. Similarly for an Al-Si0,-Si(n-type)...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 5 ppsx

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 5 ppsx

... Eq. (5. 14) Substrate Vfb df Qh Y <h VTO nMOST p-type - +- +++ pMOST n-type - -+ - (for metals and n+ polysilicon gate) - - (for metals and n+ polysilicon gate) + (for ... frequency MOS capacitance’, Solid-state Electron., 17, pp. 73 5- 7 42 (1974). ED-32, pp. 61 7-6 21 (I 9 85) . 5. 1 MOSFET with Uniformly Doped Substrate 1 75 Table 5. 1. Sign convention ofdifferent ... plot of V,h versus N,, for both nMOST and pMOST with n+ and p+ polysilicon gates for three different tux ( 150 & 250 A and 650 A), is shown in Figure 5. 5 [5] . These 162 4 MOS Capacitor...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 6 pptx

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 6 pptx

... (a) - - - 16 -3 A Nb=1.71 x 10 cm x Nb = 1.5 6 x 1Ol6c m3 N 4-2 5 x 1 0'6cm-3 0. 3- 2 6 10 I& I8 2 WIDTH (pm) (b) Fig. 5.21 (a) Aker's model for ... 0.0 u- 0.7 W Q !i 0 .6 0 > 4 0.5 0 >" ;- I 5 0.4 lY I bO.3 195 1'1'1'1'1~1'1'1~ I - Nb = 2 X 10'"cm-3 - - - - - W=20 ... both pMOST and nMOST devices, a general expression for the threshold voltage can be written as (5 .63 ) where the + and - signs are for n- and p-channel devices respectively, and AV,,...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 7 doc

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 7 doc

... Devices, ED-33, pp. 174 5-1 75 2 (1986). [77 ] S. C. Jain and P. Balk, ‘A unified analytical model for drain-induced barrierlowering and drain-induced high electric field in a short-channel MOSFET , ... MOSFET , Solid-State pp. 11 8-1 27 (1989). Electron., 30, pp. 50 3-3 11 (19 87) . [78 ] Y. Omura and K. Ohwada, ‘Threshold voltage theory for short-channel MOSFET model using a surface-potential ... nonuniformly doped MOSFETs’, IEEE Trans. Electron Devices, ED-31, PP. 30 3-3 07 (1984). [13] P. Ratnam and C. A. T. Salama, ‘A new-approach to the modeling of nonuniformly doped short-channel...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 8 potx

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 8 potx

... Qb = - cuxY = - cuxY (6 .88 ) Further, since Qi << Qb, we have Q, z Qb, so that Eq. (6.19) becomes Qb Vgb = Vfb + 4ss - CUX Solving Eqs. (6 .88 ) and (6 .89 ) for 4,s ... &eff as (6.1 48) where 5 = 0.5 for n-channel devices, and 5 = 0.25 - 0.30 for p-channel devices." Using Qb from Eq. (6. 78) and Qi from Eq. (6.79) in Eq. (6.1 48) we get In ... - -+ - Peff Ps 4, - - (6.1 64) A slightly different form for peff has also been used [24], [46], [ 68] (6.165) which has been generally expressed as [27], [Sl] (6.166) where 8, ...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 9 potx

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 9 potx

... Lett., EDL-2, pp. 46 6-4 68 ( 199 0). [80] N. Kotani and S. Kawazu, ‘Computer analysis of punch-through in MOSFETs’, Solid-state Electron., 22, pp. 6 3-7 0 ( 197 9). ED-36, pp .96 3 -9 67 ( 198 9). ( 199 0). ... Masetti. ‘A .CAD-oriented analytical MOSFET model for 34 5-3 55 ( 197 8). 99 1 -9 97 ( 197 9). L_. high-accuracy applications’, IEEE Trans. Computer-Aided Design, CAD-3, pp. 11 7- 122 ( 198 4). [13] A. ... ED-24, pp. 21 8-2 19 ( 197 7). S. K. Tewksbury, ‘N-channel enhancement-mode MOSFET characteristics from 1 0-3 00K, IEEE Trans. Electron Devices, ED-28, pp. 151 9- 1 5 29 ( 198 1). G. Gildenblat, ‘Low-temperature...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 10 pot

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 10 pot

... 32, pp. 5 7-6 3 (1989). [l5] R. Gharabagi and A. El-Nokali, ‘A charge-based model for short-channel MOS transistor capacitances’, IEEE Trans. Electron Devices, ED-37, pp. 106 4-1 072 (1990). ... conservative MOSFET model’, IEEE Trans. Computer-Aided Design, CAD-7, [14] R. Gharabagi and A. El-Nokali, ‘A model for the intrinsic gate capacitances of short-channel MOSFETYs’, Solid-state Electron., ... 1 I v,=ov to= = 105 A - - - _____ WL=50/50@m) - - WL = 50/0.65 @m) I ,' *.I' __ I I I Fig. 7.15 Measured short and long channel gate-to-source capacitance C,,...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 11 pdf

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 11 pdf

... Modeling Hot-Carrier Effects For n-channel MOSFETs, I,, or (Ib/Id) is a well accepted monitor for hot- carrier induced degradation. However, for p-channel MOSFETs both 1, [45] and ... prediction method for hot-carrier-stressed p-MOS transistors’, IEEE IEDM-91, Tech. Dig., pp. 52 5-5 28 (1988). [45] W. Weber and F. Lau, ‘Hot-carrier drifts in submicrometer p-channel MOSFETs’, IEEE ... hot-electrons/holes and degradation for p- and n-channel MOSFETS’, IEEE Electron Device Lett., EDL-6, pp. 8-1 1 (1985). M. Koyanagi, A. G. Lewis, J. Zhu, R. A. Martin, T. Y. Huang, and...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 12 ppt

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 12 ppt

... depletion HF C-V curve from an MOS capacitor. 29 __ _- 1-9 g-lng-1 1-9 416 9 Data Acquisition and Model Parameter Measurements I TEST SIGNAL - GROUND HP4275A LCR METER - Fig. ... 0" W 0 2 - 2 2 4 0 W I- < W I I I I -5 .0 -3 .0 -1 .0 1.0 3.0 5 GATE VOLTAGE V,,(V) Fig. 9.14 Typical high-frequency C-V plot of an MOS capacitor (p-substrate) with an ... the 9.2 Gate-Oxide Capacitance Measurement 425 3. Calculate C, at the flat band condition from the following equation (9.10) where the + and - signs are for n- and p-substrate, respectively,...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 13 ppsx

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 13 ppsx

... 12), North-Holland, New York, 1989. [13a] K. R. Mistry and B. Doyle, ‘AC versus DC hot-carrier degradation in n-channel MOSFETs’, IEEE Trans. Electron Devices, ED-40, pp. 9 6-1 04 (1993). ... measurement’, Solid-state Electron., 27, pp. 95 3-9 62 (1984). See also related papers, ibid, pp. 96 3-9 75 and pp. 97 7-9 88 (1984). [17] M. Kuhn, ‘A quasi-static technique for MOS C-V and surface ... developed to measure MOSFET intrinsic capacitances [loo ]-[ 1031. These methods can be broadly divided into two classes: ‘on-chip’ methods [loo ]-[ lo71 and ‘ofS-chip’ methods [108 ]-[ 113] . In the...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 14 potx

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 14 potx

... 10.6 Parameter Extraction Using Optimizer 53 1 lo-' 1 0-2 1 0-3 9 lo4 I 0-5 1 0-6 1 lo-' 1 0-2 1 0-3 9 lo4 I 0-5 1 0-6 1 0-7 10" 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 ... [l] G. T. Wright and H. M. A. Gaffur, ‘Preprocessor modeling of parameter and geometry dependence of short and narrow MOSFET for VLSI circuit simulation, optimization, and statistics with ... optimization program and has been used extensively for MOSFET model development and parameter extraction [35]. hj=ejl(Pl -~ tl) +ej2(~ 2-~ Pt2)+ +ejn(~n-~tn) a1 -a J;iT 10.5.1 Examples...
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MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 15 doc

MOSFET MODELING FOR VLSI SIMULATION - Theory and Practice Episode 15 doc

... manage- able form, if the following substitutions are made (1 1.26a) 538 11 SPICE Diode and MOSFET Models s - 1 0-4 u 1 0-5 3 1 0-6 0 U z U U 0 I %= 8.99 1 0-1 4 A r,= 15. 88R ... IEEE Int. Conf. on Computer-Aided Design, ICCAD-84, pp. 18 4-1 51 (1984). [13] S. L. Wong and C. A. T. Salama, ‘Improved simulation of p- and n-channel MOSFETs using an enhanced SPICE ... (11.28) (V, - $V2 - iX2)(X2 - V2) - +(yFJq)(X3 - Vi’2) U= Vl - (YFl/rl)X - x2 X4 + AX3 + BX2 + CX + D = 0 where the coefficients A, B, C and D are: B = - 2(V1...
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