fullerene thin films as photovoltaic material
Quartz sensor array with mesoporous silica films as functional materials
... ionized is referred to as plasma [45] Inductive coupled plasma system is used in this study to generate and sustain the plasma In this technique, plasma of gases such as nitrogen, oxygen, argon, ... testing was carried out at 10 sites and the averaged value was used as the elastic modulus and hardness It is found that the elastic modulus and hardness of the films progressively increases with ... with plasma powers of 50, 100, and 200 W Disordered pores with wide diameter variations are obtained The degree of porosity increases with the increase of processing time as well as the plasma...
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The Materials Science of Thin Films 2010 pptx
... even the classics of yesteryear, e.g., Maissel and Glang, Handbook of Thin Film Preface xv Technology (1970) and Chopra, Thin Film Phenomena (1969), as well as more recent books on thin films, e.g., ... of Thin Films 451 10.1 Introduction to Electrical Properties of Thin Films 451 Conduction in Metal Films 455 Electrical Transport in Insulating Films ... several to as much as hundreds of microns (1 micron or pm = lop6 meter), the book is primarily concerned with films that are less than pm thick (2) Only films and coatings formed from the gas phase...
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Báo cáo hóa học: " Morphologies of Sol–Gel Derived Thin Films of ZnO Using Different Precursor Materials and their Nanostructures Harish Bahadur Æ A. K. Srivastava Æ R. K. Sharma Æ Sudhir Chandra" pdf
... of ZnO as opposed to the case of use of zinc nitrate as the precursor material where the crystallization was rapid and random Because of these basic differences, the crystallite size was different ... Hamrin, Thin Solid Films 217, 133 (1992) R Kaur, A.V Singh, R.M Mehra, Mater Sci Poland 22, 201 (2004) M.N Kamlasanan, S Chandra, Thin Solid Films 288, 112 (1996) T Saeed, P O’Brien, Thin Solid Films ... thin film grown on quartz substrate by sol– gel spin process using zinc nitrate as the precursor material certain areas on the film This nature of morphology was typical of using zinc nitrate as...
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The Materials Science of Thin Films potx
... even the classics of yesteryear, e.g., Maissel and Glang, Handbook of Thin Film Preface xv Technology (1970) and Chopra, Thin Film Phenomena (1969), as well as more recent books on thin films, e.g., ... of Thin Films 451 10.1 Introduction to Electrical Properties of Thin Films 451 Conduction in Metal Films 455 Electrical Transport in Insulating Films ... several to as much as hundreds of microns (1 micron or pm = lop6 meter), the book is primarily concerned with films that are less than pm thick (2) Only films and coatings formed from the gas phase...
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The Materials Science of Thin Films 2011 pptx
... even the classics of yesteryear, e.g., Maissel and Glang, Handbook of Thin Film Preface xv Technology (1970) and Chopra, Thin Film Phenomena (1969), as well as more recent books on thin films, e.g., ... of Thin Films 451 10.1 Introduction to Electrical Properties of Thin Films 451 Conduction in Metal Films 455 Electrical Transport in Insulating Films ... several to as much as hundreds of microns (1 micron or pm = lop6 meter), the book is primarily concerned with films that are less than pm thick (2) Only films and coatings formed from the gas phase...
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encycopedia of materials characterization surfaces interfaces thin films c brundle et al bh 1992 pdf
... Diffraction LIMS LAMMA LAMMS LIMA NRMPI Laser Ionization Mass Spectrometry Laser Microprobe Mass Analysis Laser Microprobe Mass Spectrometry Laser Ionization Mass Analysis Nonresonant Multi-Photon ... format is based on properties, processing steps, materials classification, etc., rather than on a technique The emphasis of all volumes is on surfaces, interfaces, and thin films, but the emphasis ... 10.4 Sputtered Neutral Mass Spectrometry, SNMS 571 10.5 Laser Ionization Mass Spectrometry, LIMS 586 10.6 Spark Source Mass Spectrometry, SSMS 598 10.7 Glow-Discharge Mass Spectrometry, GDMS 609...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 2 pps
... Coupled Plasma Mass Spectrometry (ICPMS) 1.10.8 Inductively Coupled Plasma Mass Spectrometry (ICPMS) uses an inductively coupled plasma to generate ions that are subsequently analyzed by a mass spectrometer ... Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES), a gaseous, solid (as fine particles), or liquid (as an aerosol) sample is directed into the center of a gaseous plasma The sample ... cutters These tips are easy to make and slow to oxidize, but the resulting tip does not have as high an aspect ratio as a tungsten tip As a result, Pt-Ir tips are not as useful for imaging large...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 3 pps
... intensive aspect of TEM is the preparation of a useful sample In the early days of TEM, sample preparation was divided into two categories, one for thin films and one for bulk materials Thin- films, ... detection As h e specimen thickness increases, the likelihood of inelastic scattering increases, and hence the EELS signal increases Unfortunately, the background signal increases at a faster rate ... capabilities of a tilt stage (to as low as f10”) For studies of single crystals or epitaxial thin films, it is important to have access to as much tilt capability as possible SAD patterns often...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 5 ppt
... information.l In this regard, thin oxide films produced by passivation and corrosion phenomena have been the focus of numerous EXAFS investigations It is known that thin (420 A) passive films form on iron, ... it appears to be able to measure antiferromagnetic as well as ferromagnetic materials Surface Metting The ability of XPD and AED to measure the short-range order of materials on a very short time ... DIFFRACTION Chapter passive films on iron The consensus is that the passive film on iron is a highly disordered form of y F e 0 H Unfortunately, the majority of EXAFS studies of passive films have been...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 6 ppsx
... measured and the signal-to-noise ratio in the spectrum It has good lateral spatial resolution, which can be as low as 300 A, depending on the electron gun used and the sample material It has ... broadening and relative bindingenergy changes of the CO levels compared to the gas phase spectrum Gasphase binding energies were measured with respect to the vacuum level; solid state binding energies ... work to date has involved fundamental studies of solid state physics and chemistry, rather than materials analysis, albeit on such technologically important materials as Si, GaAs, and CdTeHg...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 7 ppt
... thicknesses for multiple-layer films was bund to be e q d to those for single-layer films For example, XRF was used successfully to analyze two triple-layer films of Cry l4 The two films, T and T2, have ... quantitative measurePIXE ments of thin metal films in the late ~ ~ has been applied successfully in a variety of fields, including corrosion and oxidation, semiconductors, metallurgy, thin films, geoscience, ... was also done on three single-layer Cr, FeNi, and Cu films (S 1, S2, and S3) prepared under identical deposition conditions to the two triplelayer films As shown in Table 3, good agreement was...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 8 pptx
... easily assigned NMR is intrinsically a bulk technique; the signal comes from the entire sample which is immersed in the magnetic field At least 10 mg of material is required (powders, thin films, ... is the infrared spectrum As technology has progressed over the last 50 years, the infrared spectrophotometer has passed through two major stages of development These phases have significantly ... crystalline materials the many vibrational modes can be classified by the symmetry of their motions and, while not rigorous, these assignments can be applied to the glassy material, as well Thus...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 9 pps
... isotope under study In many cases, solid state NMR spectra are not as straightforwardlyinterpretable as in the preceding example Furthermore, disordered materials, such as thin f l s im, 8.4 NMR 467 ... obtained on samples with surfice areas as s a l as 10 m2/g Experimentally, the detection sensitivity can be increased by increasing the applied field strength; by increasing the sample size (although ... adjacent elements in the backscattered spectrum decreases with increasing mass such that Ni and Fe are not separable, whereas C and are easily distinguished; the backscattering cross section...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 10 pdf
... the sensitivity can be as good as 2CL 50 ppm for a high-mass component, such as Pb in a low-mass substrate like Si, or as poor as a few percent, such as for C in a low-mass substrate like Al Advantages ... is often used to measure impurities in metals and other materials which are eventually used to form thin films in other materials applications In InductivelyCoupled Plasma Mass Spectrometry (ICPMS), ... in mass With the multiplex advantage, all masses are detected (paralleldetection) within an extremely high mass range (up to 10,000 atomic mass units or more) The mass multiplex advantage has...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 11 pps
... analysis to trace levels Two alternatives have been suggested as appropriate: RF-powered glow-discharge plasmas; and electron beam-assisted plasmas While efforts are being made in both directions, no ... quantitative measurements of material trapped at interfaces, for example, contaminants underlying deposited thin films or migrating to interfacial regions during subsequent processing As these and ... vaporization, a plasma (ionized vapor) cloud forms above the region of impact The interaction of the laser light with the plasma cloud further enhances the transfer of energy to the sample material As a consequence,...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 12 pot
... the magnetic films in these measurements was +4000A, rare earth films as thin as -500 A and transition metal oxide films as thin as -5000 A can be analyzed For multilayers, neutron measurements ... magnetic thin films Rare earth thin films and multilayers (materials having a repeating modulation in chemical composition) present an interesting class of materials, and neutron diffraction has been ... Langmuir-Blodgett films Surprisingly, the utility of the technique for the investigation ofother materialswas not hlly realized and its use and availability virtually ceased Only in the last four years has...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 13 pdf
... dipoldpole interactions 463 materials 651 sector spectrometer 139 Thin Films 657 sector spectrometers 552 Mapping 380,565 Mass contrast 110 Mass resolution 604 Mass scan 537 L Mass spectrometer40 L ... areas of finely divided metals, such as powders, evaporated metal films, and those found in supported metal catalysts Surface Areas by the Brunauer, Emmett and Teller BET Method The basic measurement ... 81 Impurities 361 InAsP 393 InAsSb 393 Inclusions 187 Index of refraction 405 Indirect-gap materials 152 Inductively coupled plasma mass spectrometry 47 Inductively Coupled PlasmaOptical Emission...
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