crystal imperfections seen by x ray diffraction topography
Structure of hibiscus latent singapore virus determined by x ray fiber diffraction
... viruses Chapter X- ray fiber diffraction techniques 1.2 THEORY OF FIBER DIFFRACTION 1.2.1 Diffraction by a helical structure Filamentous viruses, when exposed to X- rays, give rise to non-crystalline ... bone, hair and tendons cannot be crystallized by the protein Xray crystallographic technique These samples are suitable for study by the method of Chapter X- ray fiber diffraction techniques FD One ... viii List of figures x List of tables xii Summary xiii CHAPTER X- RAY FIBER DIFFRACTION TECHNIQUES 1-19 1.1 INTRODUCTION 1.2 THEORY OF FIBER DIFFRACTION 1.2.1 Diffraction by a helical structure...
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Báo cáo khoa học: The effect of replacing the axial methionine ligand with a lysine residue in cytochrome c-550 from Paracoccus versutus assessed by X-ray crystallography and unfolding ppt
... dissolving of the crystalline networks a single dark red crystal suitable for X- ray diffraction was obtained grown from 0.1 m bicine pH 9.0 and 3.2 m ammonium sulfate X- ray diffraction data of ... variant Crystallization trials and X- ray data collection Prior to crystallization trials protein solutions were oxidized with a mm solution of K3[Fe(CN)6] Samples were then concentrated and exchanged ... Refinement of macromolecular structures by the maximum-likelihood method Acta Crystallogr Sect D: Biol Crystallogr 53, 240–255 59 Mcree DE (1999) XtalView X t: a versatile program for manipulating...
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Báo cáo Y học: Determinants of the inhibition of a Taiwan habu venom metalloproteinase by its endogenous inhibitors revealed by X-ray crystallography and synthetic inhibitor analogues pdf
... are grouped in a superfamily of metzincin which exhibits some typical structural features, such as the Met-turn and active-site consensus HExxHxxGxxH sequence [15–17] Some organisms and mammalian ... forms The crystal structure of the unbound TM-3 [29] showed that the active-site zinc ion is replaced by a cadmium ion during the crystallization process In this report, purified TM-3 was cocrystallized ... S)3 pocket, but is only partially filled by the P)3 Ala residue of the inhibitor By close comparison of Fig 6C with 6A, this hydroxamate inhibitor has an extensive diaminoethyl group at the C-terminus,...
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Báo cáo khoa học: An X-ray diffraction study of model membrane raft structures doc
... http://www.lipidat.tcd.ie/) A list of the samples examined in this study are tabulated in the Supporting information Synchrotron X- ray diffraction measurements X- Ray diffraction measurements were performed ... and annealed by 50 thermal cycles between 20 and 65°C, ensuring a complete mixing of phospholipids Samples were stored under argon at a temperature not below °C X- Ray diffraction examination was ... phospholipid was performed by ESI-tandem MS [29] and the data are presented in Table S1 4694 Sample preparation Samples for X- ray diffraction examination (Table S2) were prepared by dissolving lipids...
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Báo cáo khoa học: Structural flexibility in Trypanosoma brucei enolase revealed by X-ray crystallography and molecular dynamics pdf
... Acta Crystallogr D Biol Crystallogr 60, 2126–2132 47 Murshudov GN, Vagin AA & Dodson EJ (1997) Refinement of macromolecular structures by the maximum-likelihood method Acta Crystallogr D Biol Crystallogr ... A, Sixma TK, Wilson KS & Lamzin VS (1997) wARP: improvement and extension of crystallographic phases by weighted averaging of multiple-refined dummy atomic models Acta Crystallogr D Biol Crystallogr ... JE, Rayment I & Reed GH (1996) A carboxylate oxygen of the substrate bridges the magnesium ions at the active site of enolase: structure of the yeast enzyme complexed with the equilibrium mixture...
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ELEMENTS OF X-RAY DIFFRACTION ppt
... of rotating anode for high -power x- rav tubes FIG 1-17 Since an x- ray tube is less than percent efficient in producing x- rays since the diffraction of x- rays by crystals is far less efficient than ... angstrom, the exact relation The region between netic X X X bemg lkX= 1.00202A worth while to review briefly some properties of electromagnetic Suppose a monochromatic beam of x- rays, i.e., x- rays of ... radiation used, because it was not until 1912 that the exact nature of x- rays was established In that year the phenomenon of x- ray diffraction by crystals was discovered, and this discovery simultaneously...
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Báo cáo các phương pháp phân tích hiện đại - đề tài X ray diffraction
... Đề Tài: X- RAY DIFFRACTION Giới thiệu Cơ sở nhiễu x tia X Máy phân tích phổ XRD Đặc trưng phổ XRD số vật liệu X- RAY DIFFRACTION Giới thiệu tia X • Năm 1895 Rơntghen tình cờ phát tia X • Năm ... Tia X Sự phát sinh tia Röngent Tia X Nhiễu x tia X Huỳnh quang tia X Phân tích cấu trúc rắn, vật liệu… X c định hàm lượng nguyên tố có mẫu Phân tích cấu trúc tinh thể nhiễu x tia X • Max von ... phổ XRD số vật liệu 4.3 Nhóm vật liệu kim loại oxit kim loại Phổ XRD kim loại Zn với x CuK α Đặc trưng phổ XRD số vật liệu Phổ XRD vật liệu TiO2 x CuK α Ứng dụng cụ thể Máy nhiễu x tia X dùng...
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Báo cáo hóa học: "Valence band offset of InN/BaTiO3 heterojunction measured by X-ray photoelectron spectroscopy" pot
... band maximum; VBO: valence band offset; XPS: X- ray photoelectron spectroscopy Authors’ contributions CJ carried out the experimental analysis and drafted the manuscript YC carried out the experimental ... emitters within the BTO substrate, which have six bonds to oxygen atoms The other one shifting by ~2 eV to a lower binding energy is attributed to TiO x suboxides on account of the TiO-terminated BTO ... accumulation at InN films by ozone induced oxidation Appl Phys Lett 2007, 90: 152106 Jia CH, Chen YH, Zhou XL, Liu GH, Guo Y, Liu XL, Yang SY, Wang ZG: InN layers grown by MOCVD on SrTiO3 substrates...
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Báo cáo hóa học: " Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy" ppt
... Oxidation study of polycrystalline InN film using in situ X- ray scattering and X- ray photoemission spectroscopy Thin Solid Films 2007, 515:4691 Lee IJ, Kim JY, Shin HJ, Kim HK: Near-edge x- ray ... heterojunctions measured by x- ray photoemission spectroscopy Appl Phys Lett 1996, 68:2541 Jia CH, Chen YH, Zhou XL, Liu GH, Guo Y, Liu XL, Yang SY, Wang ZG: InN layers grown by MOCVD on SrTiO3 substrates ... offset: High-resolution x- ray photoemission spectroscopy measurements Phys Rev B 2008, 78:033308 Liu JM, Liu XL, Xu XQ, Wang J, Li CM, Wei HY, Yang SY, Zhu QS, Fan YM, Zhang XW, Wang ZG: Measurement...
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Báo cáo hóa học: " Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy" docx
... effect measurement in the InN/sapphire film The XPS measurements were performed on a PHI Quantera SXM instrument with Al Ka (energy 1486.6 eV) as the X- ray radiation source, which had been carefully ... error of VBO induced by lattice mismatch is less than 60 meV Besides, practically all nitride epitaxial layers are characterized by dense networks of threading defects extending from the substrates ... Page of Table XPS CL spectra fitting results and VBM positions obtained by linear extrapolation of the leading edge to the extended base line of the VB spectra Sample State Binding energy (eV) Bonding...
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Báo cáo hóa học: " Measurement of w-InN/h-BN Heterojunction Band Offsets by X-Ray Photoemission Spectroscopy" docx
... matrix, leaving a positive charge of photohole and then the deexcitation of the photohole by quantized excitations the conduction-electron system However, the extrinsic plasmons are excited by ... (2010) 5:1340–1343 1341 XPS measurement was performed on PHI Quantera SXM instrument with Al Ka (hm = 1486.6 eV) as the X- ray radiation source and the angle between the X- ray source and the detector ... fitted using Voigt (mixed Lorentz–Gaussian) lineshape and Shirley background The positions of valence band maximum (VBM) in valence band (VB) spectra are determined by linear extrapolation of leading...
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Báo cáo hóa học: " Research Article Application of the HLSVD Technique to the Filtering of X-Ray Diffraction Dat" pot
... each fixed structure type X (X = C, I, D), the size n of clusters follows a lognormal distribution fX (n) = exp − sX /2 2π X sX exp − log n − log X 2s2 X , (4) M Ladisa et al with mode X and ... 5000 XRD intensity (AU) IX,n (q) = A NX (n) + X, n sin 2πqui, j aX (n) X= I 5.0 0.3 4.0 1.0 1.0 0.5 6000 given in terms of the four parameters [n0 , X , X , wX ] InX tensities scattered by nanoclusters ... and structure type X are computed by using the diffractional model based on the Debye function method [14, 15]: NX (n) X= C 5.0 0.3 4.0 1.0 1.0 0.5 Parameter X sX n0 X X X wX 4000 3000 2000 1000...
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Báo cáo lâm nghiệp: "Relationships between the intra-ring wood density assessed by X-ray densitometry and optical anatomical measurements in conifers. Consequences for the cell wall apparent density determination" pps
... lumen models Let X = · x = width of the double cell wall: s = R · T – [(R – X) · (T – X) ], s = X · (T + R) – X2 , s / S = cell wall proportion If drx = the wood density measured by x ray: apparent ... apparent density of the cell wall = drx / cell wall proportion = drx · S/s = drx · R · T / [X · (T + R) – X2 ] = drx · R · T / [X · (T + R – X) ] 2.3.2 Hexagonal model ST = area of measurement ... again, if drx = the wood density measured by x ray: apparent density of the cell wall = drx / cell wall proportion = drx · S/s = drx · H2 / (H2 – H’2) The use of rectangular and hexagonal models...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 1
... neutron diffraction - Group theoretical analysis -Temperature dependent synchrotron x- ray (-253-177 °C) E-field dependent neutron diffraction -E-field dependent synchrotron x- ray -X- ray and PLM ... stabilized by residual stresses ZFH : Zero-field-heating PP-ZFH : Prior-poling zero-field-heating E : Electric field SiC : Silicon carbide XRD : x- ray diffraction HR-XRD : High-resolution synchrotron x- ray ... PZN-PT PZN -x% PT: single crystal (S) or powder (P) P: 5
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 2
... surface X- ray 44.65o ~43.0-44.0o 42 43 44 45 46 47 2θ [010]W [100] L PZN-4.5%PT b) b) Fractured surface Intensity (arb units) X- ray X- ray 44.62 42 43 44 45 o 46 47 2θ Figure 5.1 (002) XRD profiles ... of µm [16] Synchrotron x- ray diffraction of higher energy, being 18 keV, revealed similar penetration depth in PZN-8%PT sample [32] Meanwhile, using synchrotron x- ray diffraction at 10.7 keV, ... sample This effect was explained by the compressive residual stress parallel to the sample surface generated by grinding In BaTiO3 this residual stress was estimated (from x- ray diffraction) to be...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 3
... reveal any useful structural information of the crystals hence unsuitable for x- ray diffraction studies It should be emphasized that distinct diffraction peaks were obtained from the fractured ... occurrence of the extremely broad lower 2θ peak adjacent to the main (002)R peak in standard XRD profiles of (001)-orientated PZN-PT single crystals has been examined This diffraction arises ... are relatively strain-free surface which are suitable for x- ray diffraction study of bulk structure in relaxor ferroelectric single crystals 77 ...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 4
... parallel to a certain crystallographic direction, e.g., [010]pc or [110]pc in our experiments Otherwise, the domains are not evident and the sample is covered with areas exhibiting slight but ... in the x- ray profile following any direction of polishing, suggesting that the surface phase is always present regardless of the direction and/or mode of polishing This behavior can be explained ... underlying material revealed by the focusing technique 67 [010] 50 µm [100] Figure 5.8 No clear surface domain patterns of (001)-cut PZN-4.5%PT crystal plate as a result of none crystallographic polishing...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 5
... work during the HR-XRD measurements 6.2 Theoretical considerations of diffractions from (002) planes of perovskite crystals 6.2.1 Monoclinic diffractions In PZN-PT single crystals, three different ... between the pc axes and the axes of the various M and the O phases of the perovskite crystal Table 6.1 contains the relationship between the (002) diffractions of the m and pc axes for the various ... (002) diffraction profiles, we begin with diffractions arising from untilted T microdomains By microscale domains, we mean here coarse domains of which the diffractions can be predicted by means...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 6
... micro/nanotwin diffraction theory The projections can compared with the experimental diffraction patterns obtained from the HR-XRD study of [100]L×[010]W×[001]T PZN-4.5%PT single crystals 7.2 Theoretical ... scattered areas started to exhibit extinction at most P/A angles, suggesting the occurrence of the C phase (Figure 7.9d) Above Tmax, the sample exhibited a total extinction indicating the presence ... bulk PZN-4.5%PT crystal increases smoothly with temperature until Tmax with no obvious anomaly This observation suggests that for PZN-xPT crystals with low PT contents (say, x < 5%PT), the strong...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 7
... be detected by the x- ray This would explain the observation made in the present work One deduction from the above is that under the condition when T nanotwin domains exist in the crystal and/or ... (R+T) phase mixture 8.3 Nature of rhomboedral and tetragonal micro-/nanotwin mixture in PZN(7-8)%PT at room temperature In the previous section, it has been shown that the (R+T) mixture exist in PZN-(7-8)%PT ... temperature However, careful examination of the roomtemperature RSMs revealed that only (100)T diffractions were detected but not the (001)T diffractions In this section, we shall examine the nature of...
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