... Thin Film Device Applications, Plenum Press, New York (1983). 52. Index 701 Residual stress, 41 4 Resist, 630 Resistivity, 45 3 CoSi,, 46 2 four point probe, 45 4 metal film, 45 8 ,45 9 ... Superconducting materials, 48 1 type 1 ,48 2 type 11, 48 2 Superconductivity, 48 0, 48 2, 641 tunneling, 48 3 Superconductor, 641 Superconductor film, thermal cycling, 43 7 Superlattice, 661 -662 compositional, ... Schottky emission, 46 6 -46 7 ,47 4 Scratch test, 44 4 Se, 235 Secondary electrons, 267 Secondary ion mass spectroscopy (SIMS), see Seed atoms, 622 Seeman-Bohlin geometry, 2 74 Segregation coefficient,...