... charging of the insulating resist layer. In SEM metrology of devices and masks using a conventional insulating resist, charging of the resist yields errors in the mea-surement, a problem conducting ... Polymer, 1992, 33, 48 72 -48 74. 8 H. Masuda and K. Kaeriyama., Synth. Met., 1992, 13, 46 1 -46 5.9 S. Rapi, V. Bocchi and G.P. Gardini., Synth. Met., 1988, 24, 217-221.10 D. Delabouglise and F. Garnier., ... (XA)XA=(C (in) -C(out))/C (in) orXA=1–(C(out)/C (in) ) [5]C (in) concentration of reactant IN C(out)concentration of reactant OUTFor a PFR operated in single pass mode, and assuming first order mass controlled kinet-ics, the following...