... Figure 3. 10, and the faults and vectors defined inproblem 3. 13, use Stafan to estimate fault coverage for the 10 faults. 3. 16 The four vectors of Problem 3. 13 are applied to the circuit in Figure 3. 10, ... PROBLEMS161Figure 3. 17 Using deductive fault simulation. 3. 12 Finish the fault simulation example for Figure 3. 10 in Section 3. 6.1. What isthe result vector at the outputs of AND gate J and XOR K? 3. 13 In ... Second Edition , by Alexander MiczoISBN 0-471- 439 95-9 Copyright â 20 03 John Wiley & Sons, Inc. CHAPTER 3 Fault Simulation 3. 1 INTRODUCTION Thus far simulation has been considered...
... output.NMGKLHJ101110(R,0,1)P0BADC (C,0 ,3) FEUT(K ,3, 0)(P,0,2)(Q,0,2)(U,1,0)(T,1,0)(S,2,0)S(N,0,1)(M,0 ,3) (G,2 ,3) (L,0,2)(H,0 ,3) (J,2,0)(B ,3, 2)(A,0,2)(D,0,0)RQ 204AUTOMATIC ... the good circuit the cover isFor the faulted gate the cover is1 23 001f10111011111 23 0X0p0X0 0111}p11 23 X0 0}f0X1 1}f1 210AUTOMATIC TEST PATTERN GENERATIONWe now ... by Alexander MiczoISBN 0-471- 439 95-9 Copyright â 20 03 John Wiley & Sons, Inc. CHAPTER 4 Automatic Test Pattern Generation 4.1 INTRODUCTION In Chapter 3 we looked at fault simulation....
... C1.SO1K1A1B1SI1C1F1G1H1J1D1E1SO2K2A2B2SI2C2F2G2H2J2D2E2SO 3 K 3 A 3 B 3 SI 3 C 3 F 3 G 3 H 3 J 3 D 3 E 3 SA1DDDD11000DDDDDDD0 SEQUENTIAL TEST METHODS251Figure ... tables.S0S1S2S 3 010101100(a)S0S1S2S 3 0110110(b)S0S1S2S 3 S1S 3 S1S0S1S2S 3 S001 01DataS0S1S2S 3 S1S 3 S1S 3 S1S2S 3 S0Data SEQUENTIAL ... 6, June 1976, pp. 630 – 636 .5. Marlett, Ralph, EBT: A Comprehensive Test Generation Technique for Highly SequentialCircuits, Proc. 15th Des. Autom. Conf., June 1978, pp. 33 2 33 9.6. Kriz, T. A.,...
... last.NCC0(N) CC1(N) SC0(N) SC1(N)62 3 0 072∞0∞82 3 0 092 2 0 010 7 4 0 0R12 3 45678910 418DESIGN-FOR-TESTABILITYFigure 8. 23 Forcing a bus to a known value.probable ... clocks.F1C1D QF2D QF 3 D QF4D QCK1CK2I1I2I 3 O 3 O2O1C 3 C2 CONTROLLABILITY/OBSERVABILITY ANALYSIS4 03 Figure 8.10 Truth table for arbitrary function.Note first that ... engineer who uses the interactive tool, 38 7 Digital Logic Testing and Simulation , Second Edition , by Alexander MiczoISBN 0-471- 439 95-9 Copyright â 20 03 John Wiley & Sons, Inc. CHAPTER...
... ăn dư thừa và Kỹthuậtphòng bệnh cá trong giai đoạn chuyển mùa Nguồn: vietlinh.com.vn Hiện nay, với xu hướng thâm canh hóa trong nghề nuôi thủy sản thì bệnh cá xảy ra trong quá trình nuôi ... 3 đến tháng 5 (lên đến 30 -35 0C) đều làm cho cá bị sốc bỏ ăn, suy yếu, tạo điều kiện cho sinh vật gây bệnh cá phát triển, làm cho cá dễ bệnh. Nước ao kém chất lượng do quản lý không đúng kỹ ... ghép sặt rằn 20%; hoặc cá tra 80% ghép rô phi 20% hoặc cá rô đồng 70% ghép sặt rằn 30 %. 6. Chăm sóc đúng kỹ thuật, cho ăn phải đạt 4 yêu cầu: Định lượng, định chất, định vị trí, định thời gian...
... Proc. Int. Test Conf., 1988, pp. 34 3 35 2.12. Fetherston, R. S. et al., Testability Features of AMD-K6 Microprocessor, Proc. Int. TestConf., 1997, pp. 406–4 13. 13. Dekker, R. et al., A Realistic ... Problem,IBM J. Res. Dev., Vol. 24, No. 3, May 1980, pp. 39 0 39 8.21. Khan, A., Fast RAM Corrects Errors on Chip, Electronics, September 8, 19 83, pp. 126– 130 . 540MEMORY TESTExample The vectors ... Memories,Proc. Int. Test Conf., 1988, pp. 35 3 36 1.14. Franklin, M., and K. K. Saluja, Built-in Self-Testing of Random-Access Memories, IEEEComputer, Vol. 23, No. 10, October, 1990, pp. 45–56.15....
... inp[2:0]; if (inp [3] == 0) state = 3 b010; end 3 b010: if (ir[0] == 1) state = 3 b011; // -> state 3 else state = 3 b111; // -> state 7 3 b011: case (ir[2:1]) 2′b00: state = 3 b100; 2′b01: ... = 3 b101; 2′b10: state = 3 b110; 2′b11: state = 3 b001; endcase 3 b100: begin mdr = inp;mor = ac; state = 3 b001; end 3 b101: begin ac = inp; mor = 4′bzzzz; state = 3 b001; end 3 b110: ... state = 3 b001; end 3 b111: begin ac = ac >> 1; mor = ac; state = 3 b001; end endcaseendmoduleIn this example the case statement represents a state machine. In state 3 (3 b011)there...