... module and SFQ circuit. Figures 14 (a) and (b) show an equivalent circuit and a microphotograph of the PD/SFQ converter. The chip was fabricated with the ISTEC standard process 3 (STP3) using ... Goldberg Yu.A. and N.M. Schmidt Handbook Series on Semiconductor Parameters, vol.2, M. Levinshtein, S. Rumyantsev and M. Shur, ed., World Scientific, London, 1999, pp. 62-88 K. Likharev and V. K. ... system-level tests and high-speed or high-frequency tests because the signal loss and distortion between room temperature and cryogenic temperature may especially cause problems and restrict experiments....