... wavelength of the incident radiation,and n is an integer indicating the order of diffraction. Only certain values of θ are allowed wherediffractions from different sets of parallel planes ... microscopy(STEM) make use of an electron beam accelerated through a potential of, typically, up to a few hundredthousand volts. Generically, the parts of a S/TEM consist of an electron source such ... MicroscopyFundamentally, materials derive their properties from their makeup and structure, even down to the level of the atomic ordering in alloys. To understand fully the behavior of materials as a function of...