x ray magnetic circular dichroism to xrd x ray diffraction
Báo cáo hóa học: " Research Article Application of the HLSVD Technique to the Filtering of X-Ray Diffraction Dat" pot
... type X (X = C, I, D), the size n of clusters follows a lognormal distribution fX (n) = exp − sX /2 2π X sX exp − log n − log X 2s2 X , (4) M Ladisa et al with mode X and logarithmic width sX ... strain factor as a function of the structure type and cluster size is aX (n) = X + X − X × π + atan n0 − n /wX X , π + atan n0 − /wX X (5) Table 1: Values of parameters used in (6) to compute ... atom, aX (n) the strain factor The total scattered intensity is computed as X= D 5.0 0.3 6.0 1.0 1.0 0.5 5000 XRD intensity (AU) IX,n (q) = A NX (n) + X, n sin 2πqui, j aX (n) X= I 5.0 0.3 4.0 1.0 1.0...
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Báo cáo khoa học: An X-ray diffraction study of model membrane raft structures doc
... SAXS intensity was recorded using a 2D RAPID area detector and the signal was circularly integrated to give a 1D pattern The WAXS intensity was recorded with a 1D HOTWAXS detector The sample to ... allows them to interpolate into the matrix component of the raft membrane The intimate association between receptors and effectors brought about by their integration into the matrix is an essential ... http://www.lipidat.tcd.ie/) A list of the samples examined in this study are tabulated in the Supporting information Synchrotron X- ray diffraction measurements X- Ray diffraction measurements were performed...
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ELEMENTS OF X-RAY DIFFRACTION ppt
... angstrom, the exact relation The region between netic X X X bemg lkX= 1.00202A worth while to review briefly some properties of electromagnetic Suppose a monochromatic beam of x- rays, i.e., x- rays of ... 477 * APPENDIX MULTIPLICITY FACTORS FOR POWDER PHOTOGRAPHS APPENDIX 10 LORENTZ-POLARIZATION FACTOR 478 APPENDIX 11 PHYSICAL CONSTANTS 480 CONTENTS XIV APPENDIX 12 INTERNATIONAL ATOMIC WEIGHTS, ... fixed value of t variation of E, (a) with t at a fixed value of x and (b) with x at PKOPERTIES OF X- RAYS [CHAP film arbitrary units, such as the degree of blackening of a photographic to the x- ray...
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Báo cáo các phương pháp phân tích hiện đại - đề tài X ray diffraction
... Đề Tài: X- RAY DIFFRACTION Giới thiệu Cơ sở nhiễu x tia X Máy phân tích phổ XRD Đặc trưng phổ XRD số vật liệu X- RAY DIFFRACTION Giới thiệu tia X • Năm 1895 Rơntghen tình cờ phát tia X • Năm ... phổ XRD số vật liệu 4.3 Nhóm vật liệu kim loại oxit kim loại Phổ XRD kim loại Zn với x CuK α Đặc trưng phổ XRD số vật liệu Phổ XRD vật liệu TiO2 x CuK α Ứng dụng cụ thể Máy nhiễu x tia X dùng ... XRD Máy phân tích XRD phương pháp ghi phổ XRD Máy phân tích XRD phương pháp ghi phổ XRD Cấu tạo: - Ống phát tia X: gồm anot catot - Tấm lọc tia Kβ Giá để mẫu - Detector: + Detector nhấp nháy(*)...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 1
... carbide XRD : x- ray diffraction HR -XRD : High-resolution synchrotron x- ray diffraction RSM : Reciprocal space mapping PLM : Polarized light microscope xx FWHM : Full-width-at-half-maximum ε’ ... neutron diffraction - Group theoretical analysis -Temperature dependent synchrotron x- ray (-253-177 °C) E-field dependent neutron diffraction -E-field dependent synchrotron x- ray -X- ray and PLM ... PZN-PT PZN -x% PT: single crystal (S) or powder (P) P: 5
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 2
... of polished surface on x- ray diffraction results Typical (002) XRD profile of an as-polished sample of PZN-4.5%PT is given in Figure 5.1(a) The XRD result, which relates to the surface layer of ... surface X- ray 44.65o ~43.0-44.0o 42 43 44 45 46 47 2θ [010]W [100] L PZN-4.5%PT b) b) Fractured surface Intensity (arb units) X- ray X- ray 44.62 42 43 44 45 o 46 47 2θ Figure 5.1 (002) XRD profiles ... in their lattice parameters, all contribute to the extreme broadness of the lower 2θ peak in the x- ray profile 61 Subsequent XRD (Figure 5.4) and HR -XRD (Figure 5.5) measurements were also performed...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 3
... polished-and-annealed bulk PZN-PT single crystals were found to cover with a deformed layer even after heating to above TC, giving rise to smear effect in the x- ray diffraction patterns (Figures 5.11a, c, and ... occurrence of the extremely broad lower 2θ peak adjacent to the main (002)R peak in standard XRD profiles of (001)-orientated PZN-PT single crystals has been examined This diffraction arises ... for x- ray diffraction study 5.3.2 Electrical resistance 73 The effect of room-temperature poling on the stability of the deformed surface layer was also investigated Figure 5.12 shows the XRD...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 4
... presence of the broad lower 2θ peak in the XRD profile These observations led us to believe that the specific thin domain layer is related to the polished surface To check for this, a PZN-4.5%PT sample, ... samples to different annealing treatments The heating and cooling rates used were 1.5 ºC/min Figure 5.9 shows the (002) XRD profiles of the differently annealed PZN-4.5%PT samples and the (002) XRD ... in the x- ray profile following any direction of polishing, suggesting that the surface phase is always present regardless of the direction and/or mode of polishing This behavior can be explained...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 5
... evidenced experimentally, mostly via HR -XRD studies [31, 32, 34, 35, 93] The above-described M phases show degeneracy in the am and cm vectors but not in the bm vector The degenerated am and cm vectors ... crystal axes, is thus the limiting case of MC phase when the lattice parameters am and cm are equal Because reciprocal lattice points in HR -XRD RSM are projected with respect to the pc axes, it ... Figures 6.2(d)-(h) are the corresponding diffraction patterns on the (002) RSM To explain how domain size may affect the (002) diffraction profiles, we begin with diffractions arising from untilted...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 6
... ºC, scattered areas started to exhibit extinction at most P/A angles, suggesting the occurrence of the C phase (Figure 7.9d) Above Tmax, the sample exhibited a total extinction indicating the presence ... likely assignments of the diffractions at 129 °C are hereafter referred to as (T+T*) or MB diffractions At 135 °C, in addition to the (T+T*) or MB diffractions, a new diffraction peak was detected ... room temperature to Tmax ≅ 157 °C, at which the ε’ is maximum The dielectric anomaly at Tmax shows a broad frequency dependence, which has been attributed to the dynamic relaxation processes...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 7
... the x- ray This would explain the observation made in the present work One deduction from the above is that under the condition when T nanotwin domains exist in the crystal and/or when the x- ray ... the Tσ phase to transformed to the R phase in the surface layer Thus, only R diffraction can be detected from the fractured surface For x- ray of low energy as in the present work, the diffraction ... superimposing onto the existing diffraction peaks were noted on the (002) mapping, indicating the emergence of a new phase With increasing temperature, the peaks gradually shifted towards the ω...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 8
... heating to Tmax ≅ 165 ºC, the scattered areas started to exhibit extinction at most P/A angles, suggesting the occurrence of the C phase (Figure 8.14f) Above Tmax, the sample exhibited a total extinction ... HR -XRD results presented above 8.6 (a) Summary of main observations In addition to the R diffractions, T* domains could also be detected in PZN-(68)%PT single crystals at room condition Our HR -XRD ... increasing to higher temperature (Figures 8.11d-e) At 168 ºC, scattered areas started to exhibit extinction at most P/A angles, suggesting the occurrence of the C phase (Figure 8.11f) Above Tmax, the...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 9
... the rhombohedral -to- tetragonal temperature, hereafter referred to as TR-T(L)) The poled samples were further fractured to expose the relatively strain-free (001) surfaces for HR -XRD measurements ... planes, the actual diffractions of the domain variants are outside the detection range of the high-resolution diffractometer used In fact, the diffractions detected in the HR -XRD are either: (a) ... entire MPB (standard + extended) region where (R+T) coexist, the crystal exhibits extremely high piezoelectric properties This suggests that the presence of (R+T) phase mixture in the form of micro/nanotwin...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 10
... the x- axis Both the KT and k31 of PZN-4.5%PT started to degrade after it was heated to 105 ºC 174 domains are parallel to the E-field direction which is normal to the fractured surface being x- rayed ... The intensity contours are in log scale T# indicates the vague T diffractions TNT denotes the T at ∆ω ≠ 0º 172 o ε' (x1 0 ) (a) 100 C ε' (x1 04) o (b) 105 C ε' (x1 04) (c) 115oC ε' (x1 04) o (d) 125 ... crystal transforms completely into the single C phase (c) The expanded (R+T) MPB region can be further divided into two regions In the lower PT region, 0.06 ≤ x ≤ 0.08, the T phase is metastable...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 11
... phases serve to relax the transformation stresses leading to an expanded MPB across 0.06 ≤ x ≤ 0.10 in PZN-xPT single crystals This expanded (R+T) MPB region can be further divided into two different ... are difficult to resolve with high-synchrotron x- ray as available in SSLS Higher energy x- ray of improved 182 resolution is required to resolve these fine nanotwin diffractions and to decipher ... (100)T diffractions on the fracture surface, a result attributed to the stress relaxation effect in the surface layer of the fractured crystal Such stress relaxation effects are expected to be...
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Báo cáo khoa học: The optimization of protein secondary structure determination with infrared and circular dichroism spectra docx
... it can be divided into ÔorderedÕ (denoted by O) and ÔdisorderedÕ (do) helix by giving the disordered helix assignment to the two residues at each helix end (ends) [10] or to helical residues ... the PLS-1 algorithm used here extracts factors in order of their relevance to the structure being quantified, the problem of selecting the total number of factors to use for each structure type ... the first two -to- five factors for a-helix or b-sheet typically accounted for 95% of the variation in the RaSP50 spectra For turn and other structures, up to 10 factors were required to reach the...
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Báo cáo y học: " Homonuclear 1H NMR and circular dichroism study of the HIV-1 Tat Eli variant" doc
... display similar circular dichroism (CD) spectra, while inactivation due to chemical cysteine modification dramatically changes the CD spectrum of Tat [12] Tat is usually divided into six different ... Eli Figure Circular dichroism spectra of Tat Eli in the presence of Zn2+ Circular dichroism spectra of Tat Eli in the presence of Zn2+ CD spectra of Tat Eli were measured from 260 to 178 nm at ... and V are well exposed to the solvent The extra residues in the C-terminus of Tat Eli protrude from a groove between the basic region and the cysteine-rich region and are exposed to solvent Our...
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Tài liệu Báo cáo khoa học: NMR structure of AII in solution compared with the X-ray structure of AII bound to the mAb Fab131 pptx
... experiments, respectively The mixing time for TOCSY spectra was 80 ms Mixing times for NOESY experiments were set to 100, 200, 350 and 400 ms to determine NOE build up rates A mixing time of 350 ms provided ... Carbon atoms are shown in grey, oxygen atoms in red, nitrogen atoms in blue, and hydrogen atoms in white provided for the cis X- Pro isomers of several peptides with the sequence motif X- Pro-Phe ... compared with the conformation of the hormone complexed to the high-affinity mAb Fab131 (representing the receptor-bound conformation) as determined by X- ray crystallography [30] This antibody has the...
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Báo cáo khoa học: Determination of thioxylo-oligosaccharide binding to family 11 xylanases using electrospray ionization Fourier transform ion cyclotron resonance mass spectrometry and X-ray crystallography pot
... statistics for the CTXS-Xyl5-Me complex are summarized in Table Atomic co-ordinates for the crystal structures of TRX I, TRX II, CTX, and CTXS-Xyl5-Me complex can be found Table X- ray diffraction measurement ... of thioxylo-oligosaccharide inhibitors From top to bottom: S-Xyl5-Me, S-Xyl4-Me, S-Xyl3-Me, and S-Xyl2-Me FEBS Journal 272 (2005) 23172333 ê 2005 FEBS Thioxylo-oligosaccharide binding to xylanases ... S-Xyl5-Me > S-Xyl4-Me > S-Xyl3-Me > S-Xyl2-Me > > For CTX, a similar trend, S-Xyl5-Me % S-Xyl4-Me S> Xyl3-Me > S-Xyl2-Me, was observed In fact, none > > 2323 Thioxylo-oligosaccharide binding to...
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