[...]... L Kelvin, Phil Mag 46, 82 (1898) 7 R Wiesendanger, Scanning Probe Microscopy (Springer, Berlin, 1998) 8 S Morita, R Wiesendanger, E Meyer (eds.), Noncontact Atomic Force Microscopy (Springer, Berlin, 2002) 9 E Meyer, H.J Hug, R Bennewitz, Scanning Probe Microscopy (Springer, Berlin, 2004) Part I Technical Aspects Chapter 2 Experimental Technique and Working Modes S Sadewasser Abstract Kelvin probe force. .. modes, according to (2.10), the measured surface topography approximately corresponds to a surface of constant force gradient 2.3 Kelvin Probe Force Microscopy The KPFM combines the nc-AFM with the Kelvin probe technique The macroscopic Kelvin probe technique was developed in 1898 by Lord Kelvin [17] for the measurement of surface potentials: the sample constitutes one plate of a parallel plate capacitor,... Sensitive Electrostatic Force Microscopy/ Spectroscopy 9.3.1 Single-Electron Electrostatic Force Microscopy/ Spectroscopy on Quantum Dots 9.3.2 Single-Electron Tunneling Force Microscopy/ Spectroscopy on Insulator Surfaces 9.4 Related Scanning Probe Techniques 9.4.1 Scanning Single Electron Transistor Microscopy ... lateral scale in the nanometer range One representative, the Kelvin probe force microscope (KPFM) was first developed by Nonnenmacher et al [23] and it allows to image surface electronic properties, namely the contact potential difference (CPD) The name Kelvin probe force microscope” originates from the macroscopic method developed by Lord Kelvin in 1898 using a vibrating parallel plate capacitor arrangement,... scale in the nanometer range One representative, the Kelvin probe force microscope (KPFM), was first developed by Nonnenmacher et al [4] and Weaver et al [5] and it allows to image surface electronic properties, namely the contact potential difference (CPD) The name Kelvin probe force microscope” originates from the macroscopic method developed by Lord Kelvin in 1898 using a vibrating parallel plate capacitor... 9 Electrostatic Force Microscopy Characterization of Low Dimensional Systems Yoichi Miyahara, Lynda Cockins, and Peter Gr¨ tter u 9.1 Fluctuations of the Electrostatic Potential in Semiconductor Low-Dimensional Structures 9.1.1 Kelvin Probe Force Microscopy on Semiconductor Heterostructures ... introduction to non-contact atomic force microscopy and describes the details of the various Kelvin probe force microscopy techniques 2.1 Introduction Surface science was revolutionized in 1982 by the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer [3] In 1986 the invention of the atomic force microscope (AFM) widened the range of samples from conductive to non-conductive ones... distance to the sample surface while scanning across the sample Forces exerted by the tip on the sample are minimal in non-contact mode S Sadewasser ( ) International Iberian Nanotechnology Laboratory - INL, Avda Mestre Jos´ Veiga s/n, 4715-330 e Braga, Portugal e-mail: sascha.sadewasser@inl.int S Sadewasser and T Glatzel (eds.), Kelvin Probe Force Microscopy, Springer Series in Surface Sciences 48, DOI 10.1007/978-3-642-22566-6... year since the invention of the KPFM (The search was performed on December 2nd 2010 using the search term “KPFM OR SKPM OR Kelvin force microscopy in Inspec) 1 Introduction 3 In the recent years, many books and review articles have been published on the topic of scanning probe microscopy, AFM or even nc-AFM [7–9] Sometimes these books comprise a small description or a chapter on KPFM; however, a major... in KPFM the electrostatic force is used The cantilever in an AFM is a very sensitive force sensor, thus the CPD can be measured with high sensitivity A dc-bias applied to the sample (or the tip) is controlled in such a way that the electrostatic forces between tip and sample are minimized This chapter will initially describe the working principle of non-contact atomic force microscopy (nc-AFM) and then . 7 S. Sadewasser 2.1 Introduction 7 2.2 Non-Contact Atomic Force Microscopy 8 2.3 Kelvin Probe Force Microscopy 12 2.4 AM-KPFM 14 2.5 FM-KPFM 15 2.6 Comparison. http://www.springer.com/series/409 Sascha Sadewasser Thilo Glatzel Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces 123 Editors With 189 Figures Dr.