The Materials Science of Thin Films 2011 Part 11 pot
The Materials Science of Thin Films 2011 Part 11 pot
... perpendicular and parallel, to the plane of incidence. Through the use of the Maxwell equations with appropriate interfacial boundary conditions, the amplitudes of the components of the transmitted (&,l, ... 11. 2.6. Optical Properties of Thin Dielectric and Semiconductor Films The optical properties of dielectric and semiconductor films are collected in Table 11- 2. Practically all of the ... responsible. It causes the plane of 11. 2 Properties d Optical Film Materials 523 C 2.3 WAVELENGTH ( pn) Figure 11- 6. Summary of the variation of n in TiO, films deposited by...
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The Materials Science of Thin Films 2011 Part 9 pot
... Testing of Films Bulge testing is widely used to determine the mechanical properties of thin films and membranes. In this test the film-substrate assembly is sealed to the end of a hollow ... applied to the surface of a body, they act directly on the surface atoms. The forces are also indirectly transmitted to the internal atoms via the network of bonds that are distorted by the internally ... If the normal tensile stress ax = F/A, then the force resolved on these shear planes is F cos 45 = fi /2 F. The area of the shear planes is A /cos 45 = 2/ A. Therefore, the...
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The Materials Science of Thin Films 2011 Part 1 ppt
... Fig. 1-8b. The generalized behavior shown is common for all classes of solid materials, regardless of the type of bonding or crystal structure. Although the mathematical forms of the attractive ... discipline of materials science and engineer- ing. A dramatic increase in our understanding of the fundamental nature of materials throughout much of the twentieth century has led to the development ... change of T or P will destroy the three-phase equilib- Thin Films - A Historical Perspective Thin- film technology is simultaneously one of the oldest arts and one of the newest sciences....
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The Materials Science of Thin Films 2011 Part 2 ppsx
... in the presence of an applied field. logarithm of the rate is plotted on the ordinate and the reciprocal of the absolute temperature is plotted along the abscissa. The slope of the resulting ... continuous state of random motion, which is intimately dependent on the temperature of the gas. During their motion the gas particles collide with each other as well as with the walls of the confining ... characteristic of both the diffusing species and the matrix in which transport occurs. The extent of 50 Vacuum Science and Technology is that the large number of atoms or molecules of the gas...
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The Materials Science of Thin Films 2011 Part 4 ppt
... view of the MOS field effect transistor structure in Fig. 4-1 indicates the extent to which the technology is employed. Above the plane of the base P-Si wafer, all of the films with the ... (4-34b) Note the use of the perfect gas law and the neglect of the temperature dependence of D. Maintenance of stoichiometry requires that JCd = JTez 9 (4-35) the factor of 2 arising ... requires that the ratio of the vapor pressure in the crucible to that in the vacuum chamber exceed lo4 to 10'. The arrival of ionized clusters with the kinetic energy of the acceleration...
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The Materials Science of Thin Films 2011 Part 5 docx
... estimated in the capillarity theory. The uncertainties are now in i* and E;,. One of the important applications of this theory has been to the subject of epitaxy, where the crystallographic ... of the condensate. Shadowing is a phenomenon arising from the geometric constraint imposed by the roughness of the growing film and the line -of- sight impinge- ment of arriving atoms. The ... rate of change of cluster densities in terms of the processes that occur on the substrate surface. Because these theories and models are complex mathematically as well as physically, the discussion...
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The Materials Science of Thin Films 2011 Part 6 doc
... series of post-specimen lenses. The objective lens produces the first image of the object and is, therefore, required to be the most perfect of the lenses. Depending on how the beams reaching the ... discussion of the analysis of diffraction effects is well beyond the scope of this book. Some notion of the correlation between structure and diffraction patterns can be gained from the model of thin ... time one of the diffracted beams is chosen by means of an aperture that blocks the central beam and the other diffracted beams. The micrograph of alternating 40 A-wide films in the GaAs-Al,,,Ga,~,As...
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The Materials Science of Thin Films 2011 Part 8 pps
... array of Fig. 7-26a reflects the sixfold symmetry of the (111 ) plane, and the six fainter spots in between are the result of the (7 x 7) surface reconstruction. In RHEED, on the other ... Blakely, Thin Solid Films 25, 363, 1975). 364 Interdiffusion and Reactions in Thin Films the mathematical theories of GB diffusion including discussions of transport in these different ... Avogadro's number, the activity a is defined by the product of the activity coefficient y and concentration C, and po is the chemical potential of the specie in the standard state. The force...
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The Materials Science of Thin Films 2011 Part 10 pps
... Properties of Thin Films 10.1. INTRODUCTION TO ELECTRICAL PROPERTIES OF THIN FILMS 10.1 .l. General Considerations Electrical properties of thin films have long been of practical ... by the rupture of the ultrathin tunnel barrier due to the mismatch in thermal expansion between Pb alloys and the Si substrate on which the device is built. During temperature cycling the thermal ... low. As an application of Matthiessen’s rule, consider the problem of assessing the purity and defect content of “pure” metal films. A measure of these properties is the residual resistivity...
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The Materials Science of Thin Films 2011 Part 12 pptx
... substrates. The value of K, depends on a number of factors. Most important is the nature of the materials in contact, but the extent and type of lubrication, surface temperature, and nature of the ... wavelengths, depending on whether the refractive index of the film is greater or less than that of the substrate. In the former case the reflectivity is enhanced, whereas in the latter case reflectivity ... the design of a one-layer antireflection coating, the film index of refraction should be the geometric mean of the refractive indices of adjacent media. This is only strictly true for the...
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