The Materials Science of Thin Films 2011 Part 10 pps

... Properties of Thin Films 10. 1. INTRODUCTION TO ELECTRICAL PROPERTIES OF THIN FILMS 10. 1 .l. General Considerations Electrical properties of thin films have long been of practical ... capacitance is the product of the two individual (oxide and semiconductor) capacitances divided by their sum.) Note that now the bands bend the other way -the slope of the oxide conduction-band 10. 3. ... by the rupture of the ultrathin tunnel barrier due to the mismatch in thermal expansion between Pb alloys and the Si substrate on which the device is built. During temperature cycling the thermal...

The Materials Science of Thin Films 2011 Part 2 ppsx

... in the presence of an applied field. logarithm of the rate is plotted on the ordinate and the reciprocal of the absolute temperature is plotted along the abscissa. The slope of the resulting ... continuous state of random motion, which is intimately dependent on the temperature of the gas. During their motion the gas particles collide with each other as well as with the walls of the confining ... characteristic of both the diffusing species and the matrix in which transport occurs. The extent of 50 Vacuum Science and Technology is that the large number of atoms or molecules of the gas...

The Materials Science of Thin Films 2011 Part 8 pps

... Blakely, Thin Solid Films 25, 363, 1975). 364 Interdiffusion and Reactions in Thin Films the mathematical theories of GB diffusion including discussions of transport in these different ... array of Fig. 7-26a reflects the sixfold symmetry of the (111) plane, and the six fainter spots in between are the result of the (7 x 7) surface reconstruction. In RHEED, on the other ... in the annealed films corresponds to the compounds Au,AI and AuAI,, and the high-energy tail is indicative of Au transport through the AI film to the surface. From the fact that the...

The Materials Science of Thin Films 2011 Part 1 ppt

... Fig. 1-8b. The generalized behavior shown is common for all classes of solid materials, regardless of the type of bonding or crystal structure. Although the mathematical forms of the attractive ... discipline of materials science and engineer- ing. A dramatic increase in our understanding of the fundamental nature of materials throughout much of the twentieth century has led to the development ... epitaxy, mass transport effects, and the role of stress. These are the common thin- film concerns irrespective of application. The final portion of the book (Chapters 10- 14) is largely devoted to...

The Materials Science of Thin Films 2011 Part 4 ppt

... view of the MOS field effect transistor structure in Fig. 4-1 indicates the extent to which the technology is employed. Above the plane of the base P-Si wafer, all of the films with the ... formation of stable cluster nuclei. Optimum expansion further requires that the ratio of the vapor pressure in the crucible to that in the vacuum chamber exceed lo4 to 10& apos;. The arrival of ... indicative of the excellent properties of ICB films. Among the advantages of ICB deposition are vacuum cleanliness (- lo-’ torr in the chamber) of evaporation and energetic ion bombardment of the...

The Materials Science of Thin Films 2011 Part 5 docx

... 10- ~ -10- ~ 10- * -10- 10- ~ 10- ~ -10- ~ 10- ~ 10 -8 -10 -6 10- 8 -10- 6 3 x 10- 4 10 - 8 -10- 10- 8 10- ~ -10- ~ 10- ~ -10- ~ 10- 8-5 x 10- 6 s x 10- 6 5 x 10- 8 -10- 6 10- ~ -10- ~ SiH,; SiF,-H,; Si(s)-H, ... 313 101 3-1213 313-513 523 523 1213 523-113 413-613 513-113 1213 813 523-1213 613-913 633-613 413-113 613-813 673 10 -8 -10 - 10- ~ -10- ~ 10- 8 -10- 10- ~ -10- ~ 10- * -10- 10- ~ 10- ~ -10- ~ ... certainty, nor are they easily estimated in the capillarity theory. The uncertainties are now in i* and E;,. One of the important applications of this theory has been to the subject of epitaxy,...

The Materials Science of Thin Films 2011 Part 6 doc

... series of post-specimen lenses. The objective lens produces the first image of the object and is, therefore, required to be the most perfect of the lenses. Depending on how the beams reaching the ... time one of the diffracted beams is chosen by means of an aperture that blocks the central beam and the other diffracted beams. The micrograph of alternating 40 A-wide films in the GaAs-Al,,,Ga,~,As ... energies where they strike the specimen target (anode). In the process, X-rays characteristic of atoms in the irradiated area are emitted. By an analysis of their energies, the atoms can be...

The Materials Science of Thin Films 2011 Part 9 pot

... Testing of Films Bulge testing is widely used to determine the mechanical properties of thin films and membranes. In this test the film-substrate assembly is sealed to the end of a hollow ... applied to the surface of a body, they act directly on the surface atoms. The forces are also indirectly transmitted to the internal atoms via the network of bonds that are distorted by the internally ... If the normal tensile stress ax = F/A, then the force resolved on these shear planes is F cos 45 = fi /2 F. The area of the shear planes is A /cos 45 = 2/ A. Therefore, the...

The Materials Science of Thin Films 2011 Part 11 pot

... perpendicular and parallel, to the plane of incidence. Through the use of the Maxwell equations with appropriate interfacial boundary conditions, the amplitudes of the components of the transmitted (&,l, ... concerning optical films are the magnitudes of n and k, the spectral range of transmission, the dependence of properties on film structure and deposition 10. 6. Magnetic Thin Films for Memory ... layer known as the penetration depth A,. The London theory of superconductivity indicates that ( 10- 34) 526 Optical Properties of Thin Films however, the wave propagates in the reverse...

The Materials Science of Thin Films 2011 Part 12 pptx

... substrates. The value of K, depends on a number of factors. Most important is the nature of the materials in contact, but the extent and type of lubrication, surface temperature, and nature of the ... wavelengths, depending on whether the refractive index of the film is greater or less than that of the substrate. In the former case the reflectivity is enhanced, whereas in the latter case reflectivity ... the design of a one-layer antireflection coating, the film index of refraction should be the geometric mean of the refractive indices of adjacent media. This is only strictly true for the...

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