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The Materials Science of Thin Films 2011 Part 9 pot

The Materials Science of Thin Films 2011 Part 9 pot

The Materials Science of Thin Films 2011 Part 9 pot

... A. Nicolet, Thin Solid Films 52, 415, 197 8). Chapter 9 3liiEzk Mechanical Properties of Thin Films 9. 1. INTRODUCTION Interest in mechanical-property effects in thin films has focused ... many materials it has a value of about 0.3. Under the action of shear stresses, shear strains (y) are induced; 9. 3. Internal Stresses and Their Analyses 41 9 9. 3.3. Thermal Stress Thermal ... by the product of the film stress and thickness. By Eq. 9- 19, S = ufdf = SESd:/3l2(1 - us). (9- 20) This definition circumvents difficulties in the magnitude of af in very thin films...
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The Materials Science of Thin Films 2011 Part 11 pot

The Materials Science of Thin Films 2011 Part 11 pot

... perpendicular and parallel, to the plane of incidence. Through the use of the Maxwell equations with appropriate interfacial boundary conditions, the amplitudes of the components of the transmitted (&,l, ... in the preparation of optical thin films over the years can be appreciated in the case of ZnS. A steady decrease in k from 1.1 X lo-* to 2.0 x was reported in 195 2, 195 6, and ... of Thin Dielectric and Semiconductor Films The optical properties of dielectric and semiconductor films are collected in Table 11-2. Practically all of the data are for evaporated films, ...
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The Materials Science of Thin Films 2011 Part 1 ppt

The Materials Science of Thin Films 2011 Part 1 ppt

... Phenomena ( 196 9), as well as more recent books on thin films, e.g., Pulker, Coatings on Glass ( 198 4), and Eckertova, Physics of Thin Films ( 198 6), make little or no mention of these now ... discipline of materials science and engineer- ing. A dramatic increase in our understanding of the fundamental nature of materials throughout much of the twentieth century has led to the development ... Fig. 1-8b. The generalized behavior shown is common for all classes of solid materials, regardless of the type of bonding or crystal structure. Although the mathematical forms of the attractive...
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The Materials Science of Thin Films 2011 Part 2 ppsx

The Materials Science of Thin Films 2011 Part 2 ppsx

... continuous state of random motion, which is intimately dependent on the temperature of the gas. During their motion the gas particles collide with each other as well as with the walls of the confining ... characteristic of both the diffusing species and the matrix in which transport occurs. The extent of 50 Vacuum Science and Technology is that the large number of atoms or molecules of the gas ... Microscopy of MA ( 197 8). New York ( 196 6). Materials, Wiley, New York ( 197 9). C. Defects 1. J. Friedel, Dislocations, Pergamon Press, New York ( 196 4). 38 A Review of Materials Science...
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The Materials Science of Thin Films 2011 Part 4 ppt

The Materials Science of Thin Films 2011 Part 4 ppt

... (4-34b) Note the use of the perfect gas law and the neglect of the temperature dependence of D. Maintenance of stoichiometry requires that JCd = JTez 9 (4-35) the factor of 2 arising ... view of the MOS field effect transistor structure in Fig. 4-1 indicates the extent to which the technology is employed. Above the plane of the base P-Si wafer, all of the films with the ... requires that the ratio of the vapor pressure in the crucible to that in the vacuum chamber exceed lo4 to 10'. The arrival of ionized clusters with the kinetic energy of the acceleration...
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The Materials Science of Thin Films 2011 Part 5 docx

The Materials Science of Thin Films 2011 Part 5 docx

... rate of change of cluster densities in terms of the processes that occur on the substrate surface. Because these theories and models are complex mathematically as well as physically, the discussion ... dN, dt 7s i=2 (5- 29) The equation states that the time rate of change of the monomer density is given by the incidence rate, minus the desorption rate, minus the rate at which two monomers ... The transition of polycrystalline Cu to single-crystal Cu films can be thought of as the onset of (1 1 1) epitaxy (i* = 2) from atomic nuclei (i* = 1). The Arrhenius plot of the...
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The Materials Science of Thin Films 2011 Part 6 doc

The Materials Science of Thin Films 2011 Part 6 doc

... series of post-specimen lenses. The objective lens produces the first image of the object and is, therefore, required to be the most perfect of the lenses. Depending on how the beams reaching the ... discussion of the analysis of diffraction effects is well beyond the scope of this book. Some notion of the correlation between structure and diffraction patterns can be gained from the model of thin ... time one of the diffracted beams is chosen by means of an aperture that blocks the central beam and the other diffracted beams. The micrograph of alternating 40 A-wide films in the GaAs-Al,,,Ga,~,As...
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The Materials Science of Thin Films 2011 Part 8 pps

The Materials Science of Thin Films 2011 Part 8 pps

... Blakely, Thin Solid Films 25, 363, 197 5). 364 Interdiffusion and Reactions in Thin Films the mathematical theories of GB diffusion including discussions of transport in these different ... array of Fig. 7-26a reflects the sixfold symmetry of the (111) plane, and the six fainter spots in between are the result of the (7 x 7) surface reconstruction. In RHEED, on the other ... ( 198 9). 19. * A. Y. Cho, Thin Solid Films 100, 291 ( 198 3). 20.* K. Ploog, Ann. Rev. Mater. Sci. 11, 171 ( 198 1). 21 .* M. B. Panish and H. Temkin, Ann. Rev. Mater. Sci. 19, 209...
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The Materials Science of Thin Films 2011 Part 10 pps

The Materials Science of Thin Films 2011 Part 10 pps

... by the rupture of the ultrathin tunnel barrier due to the mismatch in thermal expansion between Pb alloys and the Si substrate on which the device is built. During temperature cycling the thermal ... failure due to thermal cycling was realized. Nevertheless, for these and other reasons, Nb, a 9. 6. Adhesion 4 39 9. 6. ADHESiON 9. 6.1. Introduction The term adhesion refers to the interaction ... low. As an application of Matthiessen’s rule, consider the problem of assessing the purity and defect content of “pure” metal films. A measure of these properties is the residual resistivity...
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The Materials Science of Thin Films 2011 Part 12 pptx

The Materials Science of Thin Films 2011 Part 12 pptx

... substrates. The value of K, depends on a number of factors. Most important is the nature of the materials in contact, but the extent and type of lubrication, surface temperature, and nature of the ... wavelengths, depending on whether the refractive index of the film is greater or less than that of the substrate. In the former case the reflectivity is enhanced, whereas in the latter case reflectivity ... the design of a one-layer antireflection coating, the film index of refraction should be the geometric mean of the refractive indices of adjacent media. This is only strictly true for the...
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